metrology - D metrology,machine metrology

metrology

Get up-to-date metrology news as well as metrology related headlines such as:metrology,D metrology,machine metrology etc. Keep touch with the frequently updated news about metrology to get detail information.

metrology: News Headlines

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  Developing OLED Displays with CRAIC Technologies Microscope Spectrophotometers

  By Paul Martin on January 31, 2010 - Organic Light Emitting Diodes (OLED) are being developed for the next generation of displays and light sources. The QDI 302™ microspectrometer, from CRAIC Technologies,... [+]

  is designed to meas Read more
  metrology       microscope spectrophotometer       oled       Quality control

• 

  “Revolution in Spindle Measurement” Video Updated and Now Online

  By Mark Kretschmar on August 25, 2009 - International experts Dr. Robert Hocken, Dr. James Tlusty, and Dr. James Bryan discuss modern, high-tech spindle measurement methods and their importance in this... [+]

  12-minute video. Read more
  error motion       machine metrology       machine spindle       machining center

• 

  Optical Photovoltaic Cell Testing System from CRAIC Technologies

  By Paul Martin on October 28, 2009 - The QDI 2010 Film microspectrophotometer is a system designed to measure transmissivity, reflectivity, and the thickness of thin films used for precision manufacture... [+]

  of photovoltaic cells. Read more
  film thickness       metrology       microspectrometer       microspectrophotometer       photovoltaic       pv       testing

metrology: All News

All news and headlines about metrology. Browse news on metrology by date to get detailed information.

• Jenoptik presents latest metrology solutions at “Control” in Stuttgart. Process of...

  By Oliver Zanner on May 8, 2012 - Many innovations in high-tech metrology will be on display for the first time at the Control trade fair. With a new offic in Singapore, Jenoptik is taking the next... [+]

  step in its international expansion. Read more
  Jenoptik       metrology       singapore

• Hexagon Metrology Reports High Demand for New Line of Brown & Sharpe CMMs

  By Belinda Jones on May 9, 2012 - The Next Generation of Shop Floor CMMs Surpasses Expectations ... [+]

  Read more
  CMM       metrology       metrology devices

• Coordinate Metrology Systems Conference (CMSC) 2012 Showcases 27 Technical Presentations from...

  By Belinda Jones on May 7, 2012 - 3D Measurement/Inspection Professionals Share Knowledge of Technology Solutions ... [+]

  Read more
  metrology news

• University of Nebraska - Lincoln Selects SEMI-GAS® Equipment for New Nanoscience Metrology Facility

  By The Simon Group on May 4, 2012 - Centurion™ gas cabinets and ancillary equipment supply gas to labs and clean rooms ... [+]

  Read more
  Applied Energy Systems       centurion       Gas Cabinets       Nanoscience Metrology       SEMI GAS       ultra high purity gas       university of nebraska lincoln

• Beta LaserMike Announces Appointment of Asia Sales Director

  By Jay Luis on May 11, 2012 - Seasoned sales leader Stuart Manser brings new direction to Beta LaserMike’s Asia sales team ... [+]

  Read more
  Asia Sales Director       Beta LaserMike       gauges       measurement and controls       metrology       Sensors       Stuart Manser

• 450 mm Wireless Wafer Processing Metrology Sensors Support Next-Generation of Semiconductor...

  By Lindsey Dietz on October 11, 2011 - CyberOptics Semiconductor offers a line of wireless 450 mm wafer processing metrology sensors to help chipmakers and tool manufacturers qualify next-generation semiconductor... [+]

  production processes. Read more
  airborne particle sensor       semiconductor gapping sensor       semiconductor level sensors       semiconductor metrology       semiconductor process tools       semiconductor sensors

• Frost & Sullivan: Constantly Evolving Technologies Require Advanced and Easy-to-Use Metrology...

  By Anna Zanchi on September 13, 2011 - The global market is expected to escalate from $254.4 million of 2009 up to $331.9 million in 2014 – Expansive Product Portfolio Will Help Metrology Software Vendors... [+]

  Stave off Competition Read more
  metrology       software

• International Metrology Day 20 May 2011. Feanor OÜ awarded in International Metrology Forum...

  By Luca Bochese on May 20, 2011 - Today 20 May 2011 is the International Metrology Day and there was no better way to celebrate it than by receiving an official recognition by the Federal Agency... [+]

  of Technology and Metrology. Read more
  International Metrology Day       metrology       metrology news       metroloogia       stankin       symposium metrology       VVC Moscow

• Keithley Earns Metrology Reaccreditation, is Among the First Labs to Earn New U.S. Accreditation

  By Keithley on September 13, 2010 - Keithley Instrument, Inc., a world leader in advanced electrical test instruments and systems, has announced that its Metrology Services department has achieved... [+]

  renewal of its ISO 17025 accreditation, Read more
  electrical testing equipment       keithley instruments       Keithley labs       metrology       Reaccreditation

• Feanor opens a R&D centre in Peking for Metrology and Cutting Tools

  By Feanor Metrology on January 16, 2009 - Feanor will set up a branch in Peking in 2009, to be able to respond more quickly to customers requests in development of high efficient turbine shaft and blade... [+]

  manufacturing for aircrafts Read more
        cmm calibration       D metrology       interferometry       laser       R

• Top Metrology Private Limited announces the launch of their Business Website.

  By Top Metrology Private Limited on October 5, 2009 - Top Metrology Private Limited, Bengaluru is delighted to announce the launch of its website http://www.indiamart.com/topmetrology/ that will be of tremendous value... [+]

  to our customers. Read more
  Measuring Equipment       measuring machine       profile projectors

• Metrology Services Easier For Companies To Find Online Now

  By Michael Schaeffer on September 28, 2011 - From the power industry to manufacturing and beyond, today's companies often have a strong need for the right metrology services. ... [+]

  Read more
  Precision Measurement

• Metrology in India - Testing Laboratory in India

  By ParasharMicro on September 15, 2011 - Parashar Micro Measurement Pvt. Ltd. Since the very beginning is in practice of improving client presence. ... [+]

  Read more
  Calibration in India       Metrology in India       NABL in India       Parashar Micro Measurement       Testing Laboratory in India

• NABL in India - Metrology in India

  By ParasharMicro on September 15, 2011 - Parashar Micro Measurement Pvt. Ltd. Since the very beginning is in practice of improving client presence. ... [+]

  Read more
  Calibration in India       Metrology in India       NABL in India       Parashar Micro Measurement       Testing Laboratory in India

• Laboratory Testing Inc. Offers Accredited Electrical and Temperature Calibration

  By Sharon Bentzley on August 9, 2011 - Electrical calibration, temperature calibration and temperature uniformity surveys are A2LA accredited when performed by LTI Metrology. All calibration services... [+]

  are NIST-traceable. Read more
  a2la       calibration       electrical calibration       Laboratory Testing       lti metrology       metrology       Temperature Calibration       uniformity survey

• Bruker Demonstrates NPFLEX-LA, the Industry’s First Surface Metrology System for Quantitatively...

  By Beverly Wykoff on April 12, 2011 - ... [+]

  Patent-Pending, Comprehensive Surface Metrology Solution Enables Transportation Industry to Better Comply with Environmental Regulations and Reduce Warranty Costs Read more
  Bruker

• Dorsey Metrology announces 14 inch Profile projector

  By Peter Davis on June 28, 2010 - Dorsey Metrology, one of the world’s most respected gage makers manufacturing optical comparators in the US, is proud to announce the latest addition to their... [+]

  expanding range of products. Read more
  Optical comparator       profile projectors       Shadowgraph

• Launch of the new Aspherics Optical Profiler: PLu apex by Sensofar

  By Rosa on May 28, 2010 - The PLu apex is an Aspherics Optical Profiler based in the development of a non-contact metrology tool to profile aspheric lenses and free-form surfaces. ... [+]

  Read more
  metrology       nanotechnology       optical profiler

• Metrology Resource Website Relaunch and New Products

  By DJ on March 11, 2010 - Metrology Resource Co, a leader in precision laser measurement devices, relaunches its website this week with a longer list of products. Highlighted is the MRL-ML1... [+]

  mini sensor. Read more
  distance measurement       laser       laser distance       laser pointer       Leica Disto

• New Technology Expands Calibration Services at LTI Metrology

  By Laboratory Testing Inc./Sharon Bentzley on January 10, 2007 - LTI Metrology has added new calibration technology, Federal B-3 Comparator, Beta LaserMike and Mahr Federal Gage Block Comparator, for improved calibration capabilities... [+]

  and accuracy. Read more
  

metrology

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